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Authors: Yanmin Wu¹, Jiarui Meng¹, Haijie LI¹, Chenming Wu², Yahao Shi³, Xinhua Cheng¹, Chen Zhao², Haocheng Feng², Errui Ding², Jingdong Wang², Jian Zhang¹

Aff.: ¹School of Electronic and Computer Engineering, Peking University; ²Baidu VIS; ³Beihang University

Arxiv: https://openreview.net/pdf/fd2da0776f6305648e3c07de2e0a2c9fc6d08e5d.pdf