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Published at November 17

Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network

cs.CV
cs.AI
eess.IV

Released Date: November 17, 2024

Authors: Yin-Yin Bao1, Er-Chao Li1, Hong-Qiang Yang1, Bin-Bin Jia1

Aff.: 1College of Electrical Engineering and Information Engineering, Lanzhou University of Technology, Lanzhou, 730050, Gansu, China

Arxiv: http://arxiv.org/abs/2411.11029v1